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Super-Resolution Microscope System

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Specifications

Lateral resolution (FWHM of beads in xy) 115 nm* in 3D-SIM mode
Axial resolution (FWHM of beads in z) 269 nm* in 3D-SIM mode
Image acquisition time Up to 1 sec/frame (Slice 3D-SIM)
(requires additional 1-2 sec. for calculation)
Imaging mode Slice 3D-SIM
Stack 3D-SIM (option)
Multi-color imaging 3 colors
Simultaneous 
multi-color imaging
Compatible Laser 488 nm, 561 nm, 640 nm
Compatible microscope Motorized inverted microscope ECLIPSE Ti-E
  • Perfect Focus System
  • Motorized XY stage with encoders
  • Motorized barrier filter wheel
  • Piezo Z stage (option)
Compatible objective System can be configured with either 100x or 60x
CFI SR Apochromat TIRF 100×oil (NA1.49)
CFI Apochromat TIRF 100×oil (NA1.49)
CFI SR Plan Apochromat IR 60×WI (NA1.27)
CFI Plan Apochromat IR 60×WI (NA1.27)
Camera ORCA-Flash 4.0 sCMOS camera (Hamamatsu Photonics K.K.)
Software NIS-Elements Ar
NIS-Elements C (for Confocal Microscope C2+)
Both require additional software modules NIS-A and N-SIM Analysis
Operating conditions 20 ℃ to 28 ℃ (± 0.5 ℃)

*These values are measured using 100 nm diameter beads excited at 488 nm. Actual resolution is dependent on laser wavelength and optical configuration.


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