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Super-Resolution Microscope System

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Application Notes

Reflectance imaging for visualization of unlabeled structures using Nikon A1R and N-SIM

Reflectance imaging allows the user to form an intensity image from light backscattered by the sample.  Highly reflective markers, including a variety of nanoparticles, allows for imaging with very high signal-to-noise and virtually free of photobleaching, ideal for both confocal and structured illumination microscopies.

N-SIM for Quantitative Ultra-Structural Analyses of the Nuclear Lamina

Super-resolution Structured Illumination Microscopy (SIM), available from Nikon via the N-SIM and N-SIM E systems, allows for the observation of details inaccessible to traditional microscopes, such as confocal and widefield. In this application note we see how the N-SIM system enables quantitative multi-color evaluation of the distribution of different nuclear lamin proteins and the structures they form.


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