Nikon (r)

Nikon Instruments Inc. | Americas

Skip to main content

Benchtop Scanning Electron Microscope

Request a Quote

A powerful yet economic benchtop scanning electron microscope from Nikon and JEOL.

As an entirely new advanced imaging tool for bioscience research and industrial inspection fields, the NeoScope benchtop SEM extends your vision by combining the familiarity of a digital camera with the high resolution and depth of field of a powerful SEM. Born from the combined expertise of Nikon Instruments and JEOL, the NeoScope SEM’s advanced features are complemented by simplicity and affordability.

Key Features

High performance system in a compact, innovative model

Touch Panel

Utmost ease of operation through the touch panel system

Intuitive touch panel operation with new GUI

  • Well focused 3D morphological observation
  • Backscattered electron imaging for compositional distribution
  • Metrology supported
  • Imaging of tilted, rotated samples (Optional)

Compact, light, and energy saving

Compact Body
  • Compact body equal to an optical microscope
  • Base unit: 330mm (W) x 490mm (D) x 430mm (H); 50 kg
  • Utility: Single phase 100 V to 240 V, 50/60 Hz, 700 to 960 VA

New capabilities for imaging

Dual Frame Display

Simultaneous display of live and retrieved images allows for comparative observation

  • Secondary electron imaging and backscattered electron imaging supported at high vacuum
  • Dual frame imaging to facilitate comparison of live and retrieved images
  • A wide magnification range from the lowest 10x for wide area of view up to 60,000x

Enhanced low vacuum capability

  • Enhanced quality of backscattered electron images
  • Easy observation of non conductive samples in the direct low vacuum mode
  • Only 2 minutes 30 seconds from sample loading to imaging

Simple operation

  • Easy touch panel operation
  • A complete range of automated functions (auto focus, auto stigmator, auto contrast/brightness)
  • Easy, dependable auto gun alignment (filament centering

A complete line of optional accessories

Tilt Rotation motor drive holder
Tilt/rotation motor drive holder

  • A popular option, the tilt/rotation motor drive specimen holder allows the operator to tilt and rotate the sample for well focused 3D morphological observation.Energy dispersive X-ray spectrometer

Energy dispersive X-ray spectrometer (EDS) for elemental analysis

  • JEOL's proprietary EDS
  • Quick, reliable customer support guarantees satisfaction

 *Both options are retrofittable

Back to top