Nikon (r)

Nikon Instruments Inc. | Americas

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High Definition Resonant Scanning Confocal

Available in Europe/Africa only

Application Notes

Reflectance imaging for visualization of unlabeled structures using Nikon A1R and N-SIM

Reflectance imaging allows the user to form an intensity image from light backscattered by the sample.  Highly reflective markers, including a variety of nanoparticles, allows for imaging with very high signal-to-noise and virtually free of photobleaching, ideal for both confocal and structured illumination microscopies.


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