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Nikon Instruments Inc. | Americas

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CLEM
designed to minimize the light required for excitation in fluorescence microscopy without compromising image quality

TECHNOLOGY:

In CLEM (Controlled Light Exposure Microscopy) illumination of the fluorescent sample is determined on a per pixel basis (i.e. when and where required) by an integrated feedback process in the digital camera. Excitation light is reduced using two strategies:

The first is based on the principle that if there is no signal, then no illumination is required (for example, when imaging the background).

The second detects whether there is sufficient signal to acquire an image. If so, illumination is stopped.

APPLICATIONS:

Time-lapse acquisition of HeLa cells expressing GFP tagged histone-28. The transmitted light and fluorescence images were simultaneously acquired in the absence (A) or presence (B) of CLEM.

CLEM is ideal for live imaging as it helps to reduce photobleaching and phototoxicity; the two main limitations in live-cell microscopy. Reduced fluorescence recovery times and increased cell survival offer greater flexibility in the design of time-lapse and other live cell imaging studies.

MICROSCOPE CONFIGURATION:

• CLEM is suitable for both confocal and standard epi-fluorescence techniques.
• CLEM can be configured with Nikon's C2+ confocal microscope system, Nikon's Eclipse Ti series inverted microscope and Nikon's upright microscopes Eclipse Ni and Eclipse Ci.
• CLEM is not suitable for non-fluorescence applications.

RECOMMENDED SYSTEM:

CLEM + Nikon C2+ / Plan Fluor / Super Fluor / VC series objectives.


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