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Nikon @

FOM 2018

Mar 25 – 28 The Singapore Expo (SingEx), Singapore Booth 24,26 and 28

Visit Nikon at the upcoming FOM in Singapore

Focus on Microscopy 2018 is the continuation of a yearly conference series presenting the latest innovations in optical microscopy and their application in biology, medicine and the material sciences. Key subjects for the conference series are the theory and practice of 3D optical imaging, related 3D image processing, and reporting especially on developments in resolution and imaging modalities. The conference series covers also the rapidly advancing fluorescence labeling techniques for confocal and multi-photon 3D imaging of -live- biological specimens.

Visit Nikon on booth 24, 26 and 28, where we will be showcasing Nikon’s revolutionary upright research Ni-E microscope with our new high definition A1R 1k confocal scanner. Capturing high-quality confocal images at ultrahigh-speed and enhanced sensitivity with a resonant and galvano scanner, A1R HD is a powerful tool for the acquisition of intracellular dynamics and interaction.

Additionally, Nikon will be previewing its latest structured illumination system, N-SIM-S, featuring twice the resolution of conventional optical microscopes and high-speed image acquisition. This system will be showcased on our latest inverted microscope, the revolutionary LFOV Ti2.


Featured Products

  • New A1R-HD High Definition Resonant Scanning Confocal


    Nikon’s new resonant scanner mounted in the A1R HD scan head supports both high speed and high definition imaging.

    • Finely detailed images with a maximum resolution of 1024 x 1024
    • Higher throughput with a large 18mm FOV 
    • Minimal sample excitation and light exposure with high speed up to 420 fps
    • Up to 5 channel simultaneous imaging
    • Hybrid scanner for ultrafast photoactivation imaging
    • Galvano scanner for high resolution imaging
    • Fast and accurate spectral imaging
    • GaAsP detector unit for high-sensitivity spectral imaging
    • Simple and intuitive operation
  • Eclipse Ti2 Series Inverted Microscope


    Nikon’s newest and most advanced inverted microscope offering unprecedented FOV imaging capacity.

    • Accelerate your research with ultra-wide 25mm FOV
    • Accessible back-aperture for TIRF laser alignment
    • Perfect-Step Z-drive for precision stacking
    • Super-stable platform for nanoscale imaging
    • 4th Generation Perfect Focus System (PFS)
    • Intelligent Features and Assist Guide for Guided Workflow
    • Automatic Correction Collar for Perfect PSFs

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