Semiconductor Equipment
NWL200
Advanced IC inspection wafer loader capable of loading 100 µm thin wafers.
P3
Designed for automated pattern profile management and line width roughness monitoring of 300mm wafers.
AMI-3000
Automatic macro inspection system with high throughput and exceptional sensitivity.
Optistation-3200
300mm wafer inspection system featuring Nikon’s renowned CFI60 optics and newly designed DUV microscope.
Optistation-3100
Compact, cost-effective solution for 300mm wafer inspection in diverse applications.
Optistation-3000
An inspection system and analysis tool for R&D defect analysis delivering high-speed transfer and system stability.
Optistation-V
Compact wafer inspection solution featuring exceptional accuracy and high throughput at a modest price.
NWL-860
IC Inspection wafer loader capable of handling 6 and 8-inch (150 and 200 mm) wafers.
NWL-641
IC inspection wafer loader for 4, 5 and 6-inch (100, 125 and 150 mm) wafers.
DART Software
Semiconductor wafer inspection software offering features such as image archiving, defect review, post probe review and online communications.
NEXIV FOUP
Non-contact, fully automated wafer carrier measuring system.
