Manufacturing equipment from steppers to the most sophisticated inspection systems has given Nikon invaluable experience in the field of microelectronics. This experience has allowed Nikon to become a worldwide leader in the manufacture of advanced instruments designed specifically for the inspection of semiconductors and flat panel displays.
Modular reflected light microscope systems for wafer inspection and materials science applications.
Fabrics/Textiles, Metallurgy, MEMS, Liquid Crystal Displays, Medical Devices, Optoelectronics…
300mm wafer and mask inspection microscope systems for reflected light defect identification.
200mm wafer and mask inspection microscope systems for reflected light defect identification.
An upright microscope with dynamic auto-focus that brings fast, versatile focus to the Eclipse LV semiconductor inspection microscope series and OEM applications.