Nikon NEXIV FOUP Wafer Carrier Measuring System

Key Features

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Highlights

  • Four side planes of the carrier are continuously measured by rotating the kinematic plate in 90° increments
  • SEMI-compliant kinematic plate provides perfect X,Y,Z coordinates
  • Variety of illumination choices facilitate accurate measurements of registration pin holes and latch-key holes
  • Laser AF provides fast, non-contact measurements of wafer positions
  • Wide area, high-intensity LED illumination enables accurate measurements of wafer heights
  • 300mm, 200mm wafer carrier and SMIF Pod base

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