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Nikon Optistation-3000 Wafer Inspection System

Optistation-3000 Specifications

Wafer size 300 mm (SEMI / M1.15 / t = 750 -20 µm),
200 mm (SEMI / Please contact Nikon concerning the transfer of non-standard size wafers.)
Standard cassette types FOUP, FOSB, and FFO
Micro inspection Surface, backside, edge, and macro image capture functions
Wafer alignment Non-contact alignment
Wafer transfer system High-speed, multi-axis robot
Microscope Nikon L300 300mm wafer inspection microscope (brightfield/darkfield and DIC observation)
Expandability 200mm wafer transfer, deformed wafer transfer, and thin wafer transfer
Power usage Power supply: 200 VAC -10%, max. 10A, 50/60 Hz
Vacuum: -66.7 kPa/-30 Nl/min
Stage Manual vacuum contact stage with 360° rotation
System reliability MTBF 1500 hours, Up time > 95%

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