Nikon Instruments / Products / Semiconductor Systems / Semiconductor Equipment / NWL-641

NWL-641 IC Inspection Wafer Loader

The NWL-641 has been discontinued.

NWL-641 Specifications

Wafer Size: 6, 5 and 4 inches
Wafer Cassette: Fluoroware H-BAR type housing
Number of Wafers: 25 Wafers
Inspection Mode - NWL-641: Micro Inspection
Inspection Mode - NWL 641M: Micro Inspection and Tilt Macro Inspection
Wafer Transfer: Robotic transfer with vacuum chuck
Orientation flat/notch detection: By transmitted type sensor, Wafer angle before and after inspection can be specified in increments of 90°
Stage: Dedicated stage (rotatable 360°, with vacuum chuck)
Dimensions and Weight: NWL-641: 246 W x 655 D x 245mm H (9.7 W x 25.8 D x 9.6 in. H) - 21 kg (46.2 lb); NWL-641M: 266 W x 655 D x 245mm H (10.5 W x 25.8 D x 9.6 in. H) - 23.5 kg (51.7 lb)
Vacuum: Pressure: - 600mm Hg (-80 kPa) or less, Displacement: 10nl/min. or more
Power Source: AC 100V/120V + 10%, 50/60 Hz, 1.7A max.;AC 220V/240V + 10%, 50/60 Hz, 0.85A max.

AMS en change location

Email Updates

Nikon Instruments Inc. on LinkedIn