Nikon Instruments / Products / Semiconductor Systems / Semiconductor Equipment / AMI-3000

Nikon AMI-3000 Automatic Macro Inspection System

AMI-3000 Specifications

Wafer size: 300mm
Throughput: greater-than or equal to 150 wafers/hour
Major inspection items: Exposure errors/defocusing defects, coating errors/uneven coating, developing errors, foreign particles, scratches, etc.
Dimensions: 1417 (W) x 2503 (D) x 2430 (H) mm
Weight: Approx. 1400kg
Safety standards: Complies with SEMI S2-0200, S8-0701, CE marking.

AMS en change location

Email Updates

Nikon Instruments Inc. on LinkedIn