Nikon Instruments / Products / Semiconductor Systems / Semiconductor Equipment

Nikon Semiconductor Equipment

Uniquely positioned to meet the demands and needs of the semiconductor industry.

Nikon is a world leader in the development and manufacture of optical and digital imaging technology for semiconductor and industrial applications. Established in 1917, the Company provides complete optical systems that offer optimal versatility, performance and productivity. Nikon has shown its commitment to the future of the semiconductor industry through its aggressive product development, superior training and technical support.

Products

  • AMI-3000 Automatic Macro Inspection System
    AMI-3000

    Automatic macro inspection system with high throughput and exceptional sensitivity.

    Wafers

  • NEXIV FOUP Wafer Carrier Measuring System
    NEXIV FOUP

    Non-contact, fully automated wafer carrier measuring system.

    Wafers

  • NWL-641
    NWL-641

    IC inspection wafer loader for 6- to 4- inch (150 and 100 mm) wafers.

    Wafers

  • NWL-860
    NWL-860

    IC inspection wafer loader capable of handling 8- and 6-inch (200 and 150 mm) wafers.

    Wafers

  • NWL200 IC Inspection Wafer Loader
    NWL200

    Advanced IC inspection wafer loader capable of loading 100µm thin wafers.

    Wafers

  • Optistation-3000 Wafer Inspection System
    Optistation-3000

    An inspection system and analysis tool for R&D defect analysis delivering high-speed transfer and system stability.

    Wafers

  • Optistation-3100 Wafer Inspection System
    Optistation-3100

    Compact, cost-effective solution for 300mm wafer inspection in diverse applications.

    Wafers

  • Optistation-3200
    Optistation-3200

    300mm wafer inspection system featuring Nikon's renowned CFI60 optics and newly designed DUV microscope.

    Wafers

  • Optistation-7
    Optistation-7

    300mm inspection station delivering high precision, throughput, accuracy and ease of use.

    Wafers

  • Optistation-V Wafer Inspection System
    Optistation-V

    Compact wafer inspection solution featuring exceptional accuracy and high throughput at a modest price.

    Wafers

  • P3 Precision Pattern Profiler
    P3

    Designed for automated pattern profile management and line width roughness monitoring of 300mm wafers.

    Wafers

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