Measuring microscope | Measuring microscope
Key Words: fluorescence, DIC, darkfield, brightfield, polarizing microscopy, manual metrology, non contact measuring, digital readout (DRO)
Definition:A microscope specifically designed for metrology measurement
TECHNOLOGY:
A measuring microscope is based on the same principal as any microscope, although imaging techniques and illumination devices are generally based on reflected light illumination for observing opaque work pieces (rather than transmitted light used in the imaging of many transparent biological specimens). Measuring microscopes enable a wealth of different imaging modes, including brightfield, darkfield, simple polarizing, DIC and epi-fluorescence observations, which can be exploited to gather more information from the sample, as required. Stages on measuring microscopes are designed to accommodate a range of work piece sizes. Measurement microscopes may be equipped with linear encoders, motorized stages, automatic focusing devices and appropriate software to increase accuracy in metrology. Measurement on most measuring microscope is confined to the field-of-view and, therefore, requires operator intervention to scan the entire work piece, if required.
APPLICATIONS:
Measuring microscopes are most commonly used in quality assurance departments and industrial research environments.
MICROSCOPE CONFIGURATION:
Nikon’s MM400/800 series of measuring microscopes have been designed for industrial measuring and image analysis. Complete digital control ensures maximum measuring accuracy. These microscopes include Nikon's electronic connection hub that provides total integration of microscope peripherals managed by Emax metrology software. Emax software, which is purpose-designed for metrology, provides many of the advanced functions offered by vision measuring machines. It interacts directly with the microscope stage which has encoders on them to allow the readout of the work piece location. This enables measurement over objects which can not be seen in a single field of view. The stages themselves have a variety of sizes and can either be X, Y type or rotational. These are the first measuring microscopes to offer an optional TTL Laser Auto-Focus. This Laser AF system features a 0.5 second focusing speed with a repeatability as high as 0.5?m (20x objective 0.75?m spot diameter).
RECOMMENDED SYSTEM:
Please contact your local Nikon representative to find which of the MM400/800 series best matches your metrology needs.
